Technical Program

Paper Detail

Paper:WEP-UA.3P.3
Session:Measurement of Materials and Devices
Location:Poster Area D
Board Number:PD.3
Session Time:Wednesday, June 29, 14:40 - 16:40
Presentation Time:Wednesday, June 29, 14:40 - 15:40
Presentation: Interactive Forum
Paper Title: Applications of the Maximum Entropy Method to Electromagnetic Compatibility Measurements
Authors: David Hill, National Institute of Standards and Technology, United States

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