Technical Program

Paper Detail

Session:Measurement of Materials and Devices
Location:Poster Area D
Board Number:PD.4
Session Time:Wednesday, June 29, 14:40 - 16:40
Presentation Time:Wednesday, June 29, 14:40 - 15:40
Presentation: Interactive Forum
Paper Title: Atom-Based Electric-Field Metrology For Millimeter Wave to Sub-THz Frequencies
Authors: Christopher Holloway, Matt Simons, Joshua Gordon, NIST, United States

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