Technical Program

Paper Detail

Paper:WEP-UA.3P.5
Session:Measurement of Materials and Devices
Location:Poster Area D
Board Number:PD.5
Session Time:Wednesday, June 29, 14:40 - 16:40
Presentation Time:Wednesday, June 29, 14:40 - 15:40
Presentation: Interactive Forum
Paper Title: Free Space Material Characterization with Genetic Algorithms and Multiple Objective Cost Functions
Authors: Raenita Fenner, Loyola University MD, United States; Jonathan Frasch, Edward Rothwell, Michigan State University, United States

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